EDX-8100 | Energy Dispersive X-ray Fluorescence Spectrometer
The Energy Dispersive X-ray Fluorescence Spectroscopy (ED-XRF) is a non-destructive analytical technique for identifying and quantifying elemental compositions in solid, powder, and liquid samples. It is widely used for non-destructive elemental analysis for quality and process control in applications including metals, chemicals, polymers, environmental testing, food safety, and pharmaceuticals, etc.
Shimadzu has been a world leading manufacturer of high-quality EDXRF spectrometers and provides a comprehensive product lineup including the EDX-7200 flagship model, which supports compliance of the newest consumer and environmental regulations; the EDX-8100, which offers a high level of accuracy and speed when analyzing elements and can also detect ultra-light elements; and the EDX-LE/EDX-LE Plus, which are designed specifically for screening elements regulated by RoHS/ELV directives. Learn more about our full lineup and how you can enhance your laboratory performance below.
EDX-8100 Functional Design
- Large Sample Chamber with Small Footprint: Installed width is 20% smaller than the previous instrument (EDX-720) due to its compact body size. The EDX-8100 can accommodate samples up to a maximum size of W300 x D275 x approx. H100 mm.
- High-Visibility LED Lamp: When X-rays are generated, an X-ray indicator at the rear of the instrument and an X-RAYS ON lamp at the front turn on, so that the instrument status can be monitored even from a distance.
Energy Dispersive X-ray Fluorescence Spectroscopy Analytical Performance
The high-performance SDD detector and optimized hardware achieve a high level of sensitivity, analysis speed, and energy resolution that were previously unattainable. It supports light element analysis of 6C to, and can be used in conjunction with the helium substitution option to analyze liquid samples containing light elements (F to Al) as is.
- High Sensitivity − Lower Limit of Detection Improved 1.5 to 5 Times: The high-performance SDD detector and combination of optimized optics and primary filters achieve previously unheard-of high levels of sensitivity. The sensitivity is higher than the previous Si (Li) semiconductor detector across the entire range from light to heavy elements.
- High Speed − Throughput Increased by up to a Factor of 10: The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time. This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the Main component element.
- High Resolution: The EDX-8100 instruments achieve superior energy resolution compared to previous models by incorporating a state-of-the-art SDD detector. This reduces the effects of overlapping peaks of different elements, enhancing the reliability of the analysis results.
- No Liquid Nitrogen Required: The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time. This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the Main component element.