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OmniScan X3 Series | Phased Array Flaw Detector

Evident Industrial Solutions (formerly Olympus)

OmniScan X3 Series | Phased Array Flaw Detector

The Evident OmniScan X3 flaw detector is a complete phased array flaw detector. Powerful tools, like total focusing method (TFM) images and advanced visualization capabilities, enable you to complete your inspection with greater confidence. Twice as fast as the OmniScan MX2 (pulse repetition frequency) it offers Innovative TFM and Improved Phased Array. Its range of applications include welds, pipelines, pipes, corrosion-resistant alloys, corrosion mapping, HTHA inspection, detection of stepwise cracking, composite inspection, and flaw imaging.

 

OmniScan X3 Phased Array Flaw Detector overview

Improved Phased Array

  • Up to 3x as fast as the OmniScan MX2 flaw detector (max pulse repetition frequency)
  • Single TOFD menu for an accelerated calibration workflow
  • 800% high amplitude range reduces the need to rescan
  • Onboard Dual Linear Array™ and Dual Matrix Array™ probe support accelerates setup creation

Ease Corrosion Monitoring Using Phased Array

Using phased array to inspect corrosion offers many benefits, including excellent coverage and resolution. However, becoming proficient in phased array techniques can be challenging. The OmniScan X3 flaw detector combines advanced functions such as gate synchronization with thoughtfully designed software and simplified menus, so you can obtain accurate data more easily. Configure your setup quickly thanks to its A-scan synchronization processing and manual time-corrected gain (TCG).

 

OmniScan X3 Phased Array Flaw Detector with Innovative TFM

The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.

 

OmniScan X3 64 Phased Array and TFM Flaw Detector with Advanced Capabilities

Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM. Utilize its enhanced performance to meet the inspection challenges of thick and attenuative materials and expand your potential to develop new procedures for a wider range of applications.

 

Benefit from 64-Pulser Phased Array

Exploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point.

Slide Right: Acquired using a 32-channel OmniScan X3 unit with a 64-element probe (5L64-A32 model), this S-scan is a high-quality image but the resolution reflects the fact that only the middle 32 elements could be used for the focal law.

Slide Left: Using a full 64-element aperture (5L64-A32 probe), the OmniScan X3 64 flaw detector provides better PA resolution at the focal point, enabling you to more easily distinguish indications that are close together or in a cluster.

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