The GCMS-TQ8050NX features Enhanced Sensitivity to maximize the benefits of the Off-Axis Ion Optics. The system features three noise-reduction technologies and a detector with improved amplification performance. Due to these state-of-the- art technologies, the system can reliably detect ultra-trace femtogram-level quantities of ions. The resulting exceptional analytical sensitivity and robustness increase the value of solutions and open the door to new applications.
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